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Jan 2

Revisiting Class-Incremental Learning with Pre-Trained Models: Generalizability and Adaptivity are All You Need

Class-incremental learning (CIL) aims to adapt to emerging new classes without forgetting old ones. Traditional CIL models are trained from scratch to continually acquire knowledge as data evolves. Recently, pre-training has achieved substantial progress, making vast pre-trained models (PTMs) accessible for CIL. Contrary to traditional methods, PTMs possess generalizable embeddings, which can be easily transferred. In this work, we revisit CIL with PTMs and argue that the core factors in CIL are adaptivity for model updating and generalizability for knowledge transferring. 1) We first reveal that frozen PTM can already provide generalizable embeddings for CIL. Surprisingly, a simple baseline (SimpleCIL) which continually sets the classifiers of PTM to prototype features can beat state-of-the-art even without training on the downstream task. 2) Due to the distribution gap between pre-trained and downstream datasets, PTM can be further cultivated with adaptivity via model adapting. We propose ADapt And Merge (ADAM), which aggregates the embeddings of PTM and adapted models for classifier construction. ADAM is a general framework that can be orthogonally combined with any parameter-efficient tuning method, which holds the advantages of PTM's generalizability and adapted model's adaptivity. 3) Additionally, we find previous benchmarks are unsuitable in the era of PTM due to data overlapping and propose four new benchmarks for assessment, namely ImageNet-A, ObjectNet, OmniBenchmark, and VTAB. Extensive experiments validate the effectiveness of ADAM with a unified and concise framework.

  • 4 authors
·
Mar 13, 2023

Deep Open-Set Recognition for Silicon Wafer Production Monitoring

The chips contained in any electronic device are manufactured over circular silicon wafers, which are monitored by inspection machines at different production stages. Inspection machines detect and locate any defect within the wafer and return a Wafer Defect Map (WDM), i.e., a list of the coordinates where defects lie, which can be considered a huge, sparse, and binary image. In normal conditions, wafers exhibit a small number of randomly distributed defects, while defects grouped in specific patterns might indicate known or novel categories of failures in the production line. Needless to say, a primary concern of semiconductor industries is to identify these patterns and intervene as soon as possible to restore normal production conditions. Here we address WDM monitoring as an open-set recognition problem to accurately classify WDM in known categories and promptly detect novel patterns. In particular, we propose a comprehensive pipeline for wafer monitoring based on a Submanifold Sparse Convolutional Network, a deep architecture designed to process sparse data at an arbitrary resolution, which is trained on the known classes. To detect novelties, we define an outlier detector based on a Gaussian Mixture Model fitted on the latent representation of the classifier. Our experiments on a real dataset of WDMs show that directly processing full-resolution WDMs by Submanifold Sparse Convolutions yields superior classification performance on known classes than traditional Convolutional Neural Networks, which require a preliminary binning to reduce the size of the binary images representing WDMs. Moreover, our solution outperforms state-of-the-art open-set recognition solutions in detecting novelties.

  • 5 authors
·
Aug 30, 2022

Precision at Scale: Domain-Specific Datasets On-Demand

In the realm of self-supervised learning (SSL), conventional wisdom has gravitated towards the utility of massive, general domain datasets for pretraining robust backbones. In this paper, we challenge this idea by exploring if it is possible to bridge the scale between general-domain datasets and (traditionally smaller) domain-specific datasets to reduce the current performance gap. More specifically, we propose Precision at Scale (PaS), a novel method for the autonomous creation of domain-specific datasets on-demand. The modularity of the PaS pipeline enables leveraging state-of-the-art foundational and generative models to create a collection of images of any given size belonging to any given domain with minimal human intervention. Extensive analysis in two complex domains, proves the superiority of PaS datasets over existing traditional domain-specific datasets in terms of diversity, scale, and effectiveness in training visual transformers and convolutional neural networks. Most notably, we prove that automatically generated domain-specific datasets lead to better pretraining than large-scale supervised datasets such as ImageNet-1k and ImageNet-21k. Concretely, models trained on domain-specific datasets constructed by PaS pipeline, beat ImageNet-1k pretrained backbones by at least 12% in all the considered domains and classification tasks and lead to better food domain performance than supervised ImageNet-21k pretrain while being 12 times smaller. Code repository: https://github.com/jesusmolrdv/Precision-at-Scale/

  • 5 authors
·
Jul 3, 2024